Absolute Scale Quantitative Off-Axis Electron Holography at Atomic Resolution

Physical Review Letters
Florian WinklerRafal E Dunin-Borkowski

Abstract

An absolute scale match between experiment and simulation in atomic-resolution off-axis electron holography is demonstrated, with unknown experimental parameters determined directly from the recorded electron wave function using an automated numerical algorithm. We show that the local thickness and tilt of a pristine thin WSe_{2} flake can be measured uniquely, whereas some electron optical aberrations cannot be determined unambiguously for a periodic object. The ability to determine local specimen and imaging parameters directly from electron wave functions is of great importance for quantitative studies of electrostatic potentials in nanoscale materials, in particular when performing in situ experiments and considering that aberrations change over time.

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Citations

Feb 23, 2019·Journal of Physics. Condensed Matter : an Institute of Physics Journal·O Ávalos-OvandoS E Ulloa
Sep 30, 2020·Microscopy·Takeshi KawasakiToshiaki Tanigaki
Mar 29, 2021·Ultramicroscopy·Jacob MadsenToma Susi
Aug 20, 2021·Nature Communications·Fu-Rong ChenStig Helveg
Sep 4, 2021·Journal of Synchrotron Radiation·Yue ZhangRaimond B G Ravelli

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