Dielectrophoretic positioning of single nanoparticles on atomic force microscope tips for tip-enhanced Raman spectroscopy

Electrophoresis
Christian LeitererWolfgang Fritzsche

Abstract

Tip-enhanced Raman spectroscopy, a combination of Raman spectroscopy and scanning probe microscopy, is a powerful technique to detect the vibrational fingerprint of molecules at the nanometer scale. A metal nanoparticle at the apex of an atomic force microscope tip leads to a large enhancement of the electromagnetic field when illuminated with an appropriate wavelength, resulting in an increased Raman signal. A controlled positioning of individual nanoparticles at the tip would improve the reproducibility of the probes and is quite demanding due to usually serial and labor-intensive approaches. In contrast to commonly used submicron manipulation techniques, dielectrophoresis allows a parallel and scalable production, and provides a novel approach toward reproducible and at the same time affordable tip-enhanced Raman spectroscopy tips. We demonstrate the successful positioning of an individual plasmonic nanoparticle on a commercial atomic force microscope tip by dielectrophoresis followed by experimental proof of the Raman signal enhancing capabilities of such tips.

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Citations

Mar 13, 2016·Analytical and Bioanalytical Chemistry·Christian LeitererWolfgang Fritzsche
Apr 1, 2015·Faraday Discussions·Volker DeckertZhenglong Zhang
May 10, 2017·ACS Applied Materials & Interfaces·Peilin ZhouLianqing Liu
Nov 12, 2015·Applied Spectroscopy·Lucas LangelüddeckeVolker Deckert
Jun 24, 2017·Chemical Society Reviews·Tanja Deckert-GaudigVolker Deckert
Oct 6, 2018·Electrophoresis·Linbo LiuZhonghua Ni

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