High resolution low kV EBSD of heavily deformed and nanocrystalline Aluminium by dictionary-based indexing

Scientific Reports
Saransh SinghMarc De Graef

Abstract

We demonstrate the capability of a novel Electron Backscatter Diffraction (EBSD) dictionary indexing (DI) approach by means of orientation mapping of a highly deformed graded microstructure in a shot peened Aluminium 7075-T651 alloy. A low microscope accelerating voltage was used to extract, for the first time from a bulk sample, statistically significant orientation information from a region close to a shot crater, showing both recrystallized nano-grains and heavily deformed grains. We show that the robust nature of the DI method allows for faster acquisition of lower quality patterns, limited only by the camera hardware, compared to the acquisition speed and pattern quality required for the conventional Hough indexing (HI) approach. The proposed method paves the way for the quantitative and accurate EBSD characterization of heavily deformed microstructures at a sub-micrometer length scale in cases where the current indexing techniques largely fail.

References

Nov 19, 2011·Ultramicroscopy·Florian BachmannHelmut Schaeben
Jun 27, 2013·Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·Patrick G Callahan, Marc De Graef
Jun 10, 2015·Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·Yu H ChenAlfred O Hero
Sep 8, 2015·Ultramicroscopy·Stuart I WrightMichael A Jackson
Dec 20, 2015·Ultramicroscopy·T L BurnettP J Withers

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Citations

Jun 1, 2019·Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·Chaoyi ZhuKenneth Vecchio
May 15, 2020·Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·Kevin KaufmannKenneth S Vecchio
Dec 19, 2020·Ultramicroscopy·Clément ErnouldEmmanuel Bouzy
Apr 16, 2021·Scientific Reports·Kevin KaufmannKenneth S Vecchio
Jun 8, 2021·Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·Kevin Kaufmann, Kenneth S Vecchio

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Methods Mentioned

BETA
X-ray
feature extraction

Software Mentioned

Auto Slice and View
Aztec
MTEX

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