Influence of the elliptical illumination on acquisition and correction of coherent aberrations in high-resolution electron holography

Ultramicroscopy
Michael Lehmann

Abstract

In high-resolution off-axis electron holography, the interpretable lateral resolution is extended up to the information limit of the electron microscope by means of a correcting phase plate in Fourier space. A plane illuminating electron wave is generally assumed. However, in order to improve spatial coherence, which is essential for holography, the object under investigation is illuminated with an elliptically shaped electron source. This special illumination imposes a variation of beam directions over the field of view. Therefore, due to the interaction of beam tilt and coherent wave aberration, the effective aberrations vary over the field of view yielding a loss of isoplanicity. Consequently, in the past the aberrations were only corrected successfully for a small part of the field of view. However, a thorough analysis of the holographic imaging process shows that the imaging artifacts introduced by the elliptical illumination can be corrected under reconstruction by means of a phase curvature, which models the illuminating wave front. Applied in real space, this phase curvature is seamlessly incorporated into the correction process for coherent wave aberration resulting in an improvement of interpretable lateral resolution...Continue Reading

References

Jan 16, 1995·Physical Review Letters·A OrchowskiH Lichte
Dec 21, 2002·Ultramicroscopy·Hannes LichteMichael Lehmann
Jan 21, 2003·Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·Michael Lehmann, Hannes Lichte

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Citations

Apr 10, 2014·Ultramicroscopy·Robert A McLeodMarek Malac
Aug 19, 2009·Philosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences·Hannes LichteMartin Linck
Dec 22, 2007·Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·Dorin GeigerMichael Lehmann
Jan 4, 2008·Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·David J Smith
Dec 3, 2015·Ultramicroscopy·Shery L Y ChangRafal E Dunin-Borkowski
Jul 9, 2013·Ultramicroscopy·Hannes LichteDaniel Wolf
Dec 17, 2014·Ultramicroscopy·Shery L Y ChangRafal E Dunin-Borkowski
Feb 27, 2014·Micron : the International Research and Review Journal for Microscopy·T Niermann, M Lehmann
May 15, 2018·Physical Review Letters·Florian WinklerRafal E Dunin-Borkowski

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