Modeling image distortions in 3DAP

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
F VurpillotD J Larson

Abstract

A numerical model has been developed to simulate images obtained from the three-dimensional atom probe. This model was used to simulate the artefacts commonly observed in two-phase materials. This model takes into account the dynamic evolution of the atomic-scale shape of the specimen during field evaporation. This article reviews the model and its applications to some specific cases. Local magnification effects were studied as a function of the size, the shape, and the orientation of precipitated phases embedded in the matrix. Small precipitates produce large aberrations in good agreement with experiments. The magnification from such precipitates, as measured from the simulation, is only found to match the theoretical value for mesoscopic scale precipitates (size similar to the specimen size). Orientation effects are also observed in excellent agreement with experiments. The measured thickness of a grain-boundary-segregated film in the simulation is found to decrease with the angle between the normal to the grain boundary and the tip axis. Depth scaling artefacts caused by variation in the evaporation field of atoms in multilayer structures were successfully simulated and again showed good agreement with effects observed exper...Continue Reading

References

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Citations

Feb 13, 2013·Ultramicroscopy·F VurpillotB Deconihout
Apr 24, 2013·Ultramicroscopy·Francois VurpillotD J Larson
Nov 16, 2007·Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·Keith E KniplingDavid N Seidman
Jan 20, 2010·Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·Baptiste GaultSimon P Ringer
Nov 20, 2014·Nature Communications·Michael P MoodySimon P Ringer
Mar 19, 2013·Ultramicroscopy·Christian OberdorferGuido Schmitz
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Sep 29, 2011·Ultramicroscopy·Baptiste GaultSimon P Ringer
Dec 15, 2010·Ultramicroscopy·B GaultB P Geiser
Mar 5, 2015·Ultramicroscopy·Christian OberdorferGuido Schmitz
Apr 12, 2016·Ultramicroscopy·Daniel BeinkeGuido Schmitz
Aug 26, 2011·Ultramicroscopy·F VurpillotA Bostel
Jan 10, 2012·Langmuir : the ACS Journal of Surfaces and Colloids·Yi ZhangKurt R Hebert
Sep 4, 2018·Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·Ingrid McCarrollJulie M Cairney
Sep 17, 2015·Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·Masaki KubotaYasuyoshi Nagai
Aug 30, 2013·Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·Daniel HaleyGeorge D W Smith
Apr 18, 2013·Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·D K SchreiberS M Bruemmer
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Oct 5, 2010·Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·Christian Oberdorfer, Guido Schmitz
Jan 22, 2020·Nanoscale·Daniel BeinkeGuido Schmitz
Nov 22, 2018·Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·Daniel Beinke, Guido Schmitz
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Dec 3, 2021·Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·Sudip Kumar SarkarAniruddha Biswas

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