Surface properties of atomically flat poly-crystalline SrTiO3

Scientific Reports
Sungmin WooWoo Seok Choi

Abstract

Comparison between single- and the poly-crystalline structures provides essential information on the role of long-range translational symmetry and grain boundaries. In particular, by comparing single- and poly-crystalline transition metal oxides (TMOs), one can study intriguing physical phenomena such as electronic and ionic conduction at the grain boundaries, phonon propagation, and various domain properties. In order to make an accurate comparison, however, both single- and poly-crystalline samples should have the same quality, e.g., stoichiometry, crystallinity, thickness, etc. Here, by studying the surface properties of atomically flat poly-crystalline SrTiO3 (STO), we propose an approach to simultaneously fabricate both single- and poly-crystalline epitaxial TMO thin films on STO substrates. In order to grow TMOs epitaxially with atomic precision, an atomically flat, single-terminated surface of the substrate is a prerequisite. We first examined (100), (110), and (111) oriented single-crystalline STO surfaces, which required different annealing conditions to achieve atomically flat surfaces, depending on the surface energy. A poly-crystalline STO surface was then prepared at the optimum condition for which all the domains ...Continue Reading

References

Oct 15, 1996·Physical Review. B, Condensed Matter·G Kresse, J Furthmüller
Dec 1, 1996·Physical Review. B, Condensed Matter·A GuptaJ Z Sun
Sep 2, 1996·Physical Review Letters·H Y HwangB Batlogg
Oct 28, 1996·Physical Review Letters·J P PerdewM Ernzerhof
Dec 2, 1994·Science·M KawasakiH Koinuma
Oct 5, 2012·Advanced Materials·Woo Seok ChoiHo Nyung Lee

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Citations

Feb 9, 2016·Nano Letters·Jeongmin ParkDongseok Suh
Jan 17, 2017·ACS Applied Materials & Interfaces·Sang A LeeWoo Seok Choi
Dec 28, 2018·Advanced Materials·Kyeong Tae KangWoo Seok Choi
Nov 9, 2018·ACS Applied Materials & Interfaces·Tae Sup YooWoo Seok Choi

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Methods Mentioned

BETA
atomic force microscopy
AFM
x-ray diffraction

Software Mentioned

OIM Analysis
VASP code

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