Toward 3D imaging of corrosion at the nanoscale: Cross-sectional analysis of in-situ oxidized TEM samples

Micron : the International Research and Review Journal for Microscopy
Wayne Harlow, Mitra L Taheri

Abstract

Understanding the effect of microstructural features on corrosion behavior will allow for significant improvements to alloy design for harsh environments. Recently, in-situ TEM has been recognized to offer significant data on corrosion behavior at the nanoscale, but in order for the best information to be acquired, a three dimensional view of the oxidation process is needed so that oxide structure and phase can be identified. Described herein is a new method of sample preparation for transmission electron microscopy (TEM) using a focused ion beam (FIB) to cross-section a previously FIB prepared sample. In-situ TEM was used to oxidize a sample using an environmental cell, and this in-situ sample is cross-sectioned to study oxide depth and oxide structure. This technique provides a new method to investigate in-situ TEM samples in 3D.

References

Jun 20, 1998·Microscopy Research and Technique·L A GiannuzziF A Stevie
Feb 24, 2006·Journal of Electron Microscopy·Takeo KaminoKeisuke Kishita
Jun 17, 2008·Ultramicroscopy·J F CreemerH W Zandbergen
Oct 25, 2011·Nature Nanotechnology·Niels de Jonge, Frances M Ross

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